I was born in Chioggia (Venezia), Italy, in 1973 and received the degree in Electronic Engineering from the University of Padova (Italy) on May 1998 with magna cum laude. On February 2002 I received the Ph.D. in Electronic and Telecommunication Engineering from the University of Padova. The Ph.D. was on CMOS device physics, technology, and reliability.
On December 2002 I join the Department of Information Engineering of the University of Padova as Assistant Professor. My research interests involved the characterization, the reliability, and the modeling of electronic devices, ranging from the deep-submicron bulk and SOI CMOS devices, non-volatile memories, organic semiconductor devices, and III-V semiconductor MOSFETs. From 2008, I started a new research line and a new research laboratory in the Microelectronic group of the University of Padova focused on the characterization, reliability and modeling of organic electronic, optoelectronic, and photovoltaic devices. This activity started by a Academic Project funded by the University of Padova (CPDA083941/08 , “Characterization and Reliability of Organic Electronic Devices for low-power and low-cost applications”).
At Present I work as Associate Professor at the Department of Information Engineering - University of Padova. My research interests are reliability issues in organic semiconductors photovoltaic devices, and RF-MEMS swiches.
I am Senior Member of the IEEE and I am member of the IEEE Electron Devices Society and IEEE Nuclear and Plasma Sciences Society.
I am author or co-author of several publications in international journals and conferences.
I am reviewer of several international journals such as IEEE TRANSACTIONS ON NUCLEAR SCIENCE, IEEE ELECTRON DEVICE LETTERS, and SOLID STATE ELECTRONICS.
I am reviewer of IEEE Transaction on Electron Devices, IEEE Transaction on Devices and Material Reliability, IEEE Transaction on Nuclear Science, IEEE Electron Device Letters, Solid State Electronics, Microelectronic Reliability
I served in the Technical Program Committee of several conferences, such as: IEEE – Nuclear and Space Radiation Effects Conference (NSREC), Radiation and its Effects on Components and Systems (RADECS), IEEE – International Reliability Physics Symposium (IRPS), European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), European Solid State Device Conference (ESSDERC).