Research Activities
2008-Present
- Characterization Modelling and reliability of organic semiconductors devices (thin film transistors, organic solar cells and organic LED) see
http://most.dei.unipd.it for details:
- Reliability of RF-MEMS Switches
- Characterization and Reliability Photovoltaic devices
2006-2008
- Ionizing radiation effects in novel non volatile memory devices (nanocrystal memory, ferroelectric memory, and phase change memory)
2002-2006
- Electrostatic Discharge effects on the breakdown, reliability and performance of CMOS devices
- Impact of oxide degradation and breakdown on device and circuit performance and functionality
- Electrical characterization, reliability and radiation effects of submicron and decananometer bulk and SOI MOSFET
1998-2002
- Effects of ionizing radiation on MOS capacitor
- Reliability issues of deep submicron CMOS technology: breakdown and hot electron degradation of ultra-thin gate oxide MOS structures
