Characterization and reliability of wide bandgap semiconductors devicesCharacterization, modeling and reliability of advanced optoelectronic devices: towards high efficiency LEDs, lasers and solar cellDesign, characterization and development of Electrostatic Discharge (ESD) protection structures for advances CMOS and Smart PowerDevelopment and reliability investigation of Radio Frequency Micro Electro Mechanical Systems (RF-MEMS)Instrumentation and MeasurementLow-power integrated ci